Sunnyvale, CA, United States of America

Herve Deslandes


 

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 24(Granted Patents)


Location History:

  • Saint Martin d'Uriage, FR (2015 - 2017)
  • Sunnyvale, CA (US) (2014 - 2020)

Company Filing History:


Years Active: 2014-2020

Loading Chart...
Loading Chart...
10 patents (USPTO):Explore Patents

Title: Herve Deslandes: Innovator in Optical Probing Technologies

Introduction

Herve Deslandes is a prominent inventor based in Sunnyvale, California, known for his significant contributions to optical probing technologies. With a total of 10 patents to his name, Deslandes has made remarkable advancements in the field of semiconductor testing and fault isolation.

Latest Patents

One of his latest patents is titled "System and method for fault isolation by emission spectra analysis." This invention discloses an apparatus and method for optical probing of a device under test (DUT). The system enables the identification, localization, and classification of faulty devices within the DUT. A selected area of the DUT is imaged while it receives test signals, which may be static or dynamic, causing certain active devices to modulate. Light from the DUT is collected and passed through a rotatable diffracting element before being imaged by a sensor and converted into an electrical signal. The resulting image changes depending on the rotational positioning of the grating, allowing for the inspection of the diffracted image to identify, localize, and classify faulty devices.

Another notable patent is the "Optimized wavelength photon emission microscope for VLSI devices." This method involves emission testing of a semiconductor device by mounting the DUT onto a test bench of an emission tester equipped with an optical detector. The DUT is electrically connected to an electrical tester, and electrical test signals are applied while keeping test parameters constant. An optical filter is inserted into the optical path of the emission tester to collect emission test signals, and the images obtained with and without the filter are compared. The filter may be shortpass, bandpass, or longpass, depending on the desired emission signal.

Career Highlights

Herve Deslandes has worked with several notable companies throughout his career, including Dcg Systems GmbH and FEI EFA, Inc. His experience in these organizations has contributed to his expertise in the field of optical probing and semiconductor testing.

Collaborations

Deslandes has collaborated with talented individuals such as Rudolf Schlangen and Prasad Sabbineni. These collaborations have further enriched his work and innovations in the industry.

Conclusion

Herve Deslandes is a distinguished inventor whose work in optical probing technologies has significantly impacted the semiconductor testing field. His innovative patents and collaborations highlight his commitment to advancing technology and improving fault isolation

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…