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For the Inventor, By the Inventor

Cupertino, CA, United States of America

Hucheng Lee

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This inventor holds 26 USPTO granted patents and 3 published patent applications, primarily in Defect Detection Technology. Top assignees: Kla Corporation, Kla Tencor Corporation. Active years: 2017-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hucheng Lee. Retrieved from https://idiyas.com/inventor/hucheng-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 26 

% Patents Active = 96.2

Average Co-Inventor Count = 3.5

ph-index = 4

Forward Citations = 47(Granted Patents)


Company Filing History:

goldMedal13 out of 619 
 
Kla Corporation
 patents
silverMedal13 out of 1,787 
 
Kla Tencor Corporation
 patents

Years Active: 2017-2026

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Areas of Expertise:
Defect Detection
Image Alignment
Semiconductor Inspection
DRAM Design
Optical Imaging
Noise Characteristics
Process Control
Wafer Inspection
Pixel Alignment
Recipe Monitoring
3D NAND Devices
Visual Feedback
26 patents (USPTO):Explore Patents
1. 12743768 - Adaptive and robust detection of large defects and image misalignment (2026-09-22),
2. 12444155 - Robust image-to-design alignment for dram (2025-10-14),
3. 12190498 - Print check repeater defect detection (2025-01-07),
4. 12056867 - Image contrast metrics for deriving and improving imaging conditions (2024-08-06),
5. 11783470 - Design-assisted inspection for DRAM and 3D NAND devices (2023-10-10),
6. 11619592 - Selecting defect detection methods for inspection of a specimen (2023-04-04),
7. 11615993 - Clustering sub-care areas based on noise characteristics (2023-03-28),
8. 11416982 - Controlling a process for inspection of a specimen (2022-08-16),
9. 11308606 - Design-assisted inspection for DRAM and 3D NAND devices (2022-04-19),
10. 11244442 - Method and system for correlating optical images with scanning electron microscopy images (2022-02-08),
11. 11049745 - Defect-location determination using correction loop for pixel alignment (2021-06-29),
12. 11010885 - Optical-mode selection for multi-mode semiconductor inspection (2021-05-18),
13. 10923317 - Detecting defects in a logic region on a wafer (2021-02-16),
14. 10599944 - Visual feedback for inspection algorithms and filters (2020-03-24),
15. 10557802 - Capture of repeater defects on a semiconductor wafer (2020-02-11),

Title: The Innovative Journey of Hucheng Lee

Introduction: Hucheng Lee, a talented inventor based in Cupertino, CA, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Lee's latest patents focus on advancements in artificial intelligence and machine learning algorithms, revolutionizing the way we interact with technology on a daily basis.

Career Highlights: With a background in computer science and engineering, Lee has worked for several leading tech companies, where he honed his skills and developed a keen understanding of emerging technologies.

Collaborations: Throughout his career, Lee has collaborated with top researchers and engineers in the industry, fostering a culture of innovation and creativity in all his projects.

Conclusion: Hucheng Lee's dedication to pushing the boundaries of technology and his passion for creating innovative solutions make him a true pioneer in the field of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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