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For the Inventor, By the Inventor

Gilroy, CA, United States of America

Gabor D Toth

This inventor holds 22 USPTO granted patents, primarily in Charged Particle Microscopy. Top assignees: Kla-Tencor Technologies Corporation, Kla Tencor Corporation, Kla Corporation. Active years: 2004-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gabor D Toth. Retrieved from https://idiyas.com/inventor/gabor-d-toth

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 22

% Patents Active = 45.5

Average Co-Inventor Count = 3.4

ph-index = 9

Forward Citations = 226(Granted Patents)


Location History:

  • Gilroy, CA (US) (2017)
  • San Jose, CA (US) (2004 - 2021)

Company Filing History:

goldMedal14 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
silverMedal7 out of 1,787 
 
Kla Tencor Corporation
 patents
bronzeMedal1 out of 620 
 
Kla Corporation
 patents

Years Active: 2004-2021

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Areas of Expertise:
Charged Particle Microscopy
Image Stabilization
Defect Characterization
Electron Imaging
Auger Electron Spectrometer
Wien Filter
Time of Flight Detector
Automated Focusing
Multi-Channel Acquisition
Copper Substrate Analysis
E-Beam Inspection
Hyperbolic Field Detectors
22 patents (USPTO):Explore Patents
1. 11120969 - Method and system for charged particle microscopy with improved image beam stabilization and interrogation (2021-09-14),
2. 10643819 - Method and system for charged particle microscopy with improved image beam stabilization and interrogation (2020-05-05),
3. 9666411 - Virtual ground for target substrate using floodgun and feedback control (2017-05-30),
4. 8941049 - Readout methodology for multi-channel acquisition of spatially distributed signal (2015-01-27),
5. 8421030 - Charged-particle energy analyzer (2013-04-16),
6. 8237120 - Transverse focusing action in hyperbolic field detectors (2012-08-07),
7. 8045145 - Systems and methods for acquiring information about a defect on a specimen (2011-10-25),
8. 7792351 - Defect review using image segmentation (2010-09-07),
9. 7755042 - Auger electron spectrometer with applied magnetic field at target surface (2010-07-13),
10. 7684609 - Defect review using image segmentation (2010-03-23),
11. 7635842 - Method and instrument for chemical defect characterization in high vacuum (2009-12-22),
12. 7394067 - Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems (2008-07-01),
13. 7247849 - Automated focusing of electron image (2007-07-24),
14. 7164139 - Wien filter with reduced chromatic aberration (2007-01-16),
15. 7148073 - Methods and systems for preparing a copper containing substrate for analysis (2006-12-12),

Title: The Innovations of Gabor D. Toth: Pioneering Advances in Charged Particle Microscopy

Introduction

Gabor D. Toth, an accomplished inventor based in Gilroy, CA, has made significant strides in the field of charged particle microscopy. Holding an impressive portfolio of 22 patents, his inventions are pivotal in enhancing imaging technologies used in various scientific applications.

Latest Patents

Among his notable patents is the "Method and system for charged particle microscopy with improved image beam stabilization and interrogation." This groundbreaking system features a scanning electron microscopy design that optimizes image beam stability. It incorporates an electron beam source to generate an electron beam, alongside a series of electron-optical elements directing the beam to the sample. Additionally, the system is equipped with an emittance analyzer assembly and a splitter element to manage secondary and backscattered electrons emitted from the sample's surface. This innovative design enables comprehensive imaging of these electrons, enhancing the quality and reliability of the resultant data.

Career Highlights

Gabor has contributed to the advancements in technology while working at prominent organizations, including KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His tenure at these companies has undoubtedly influenced his innovative approach to microscopy and imaging systems.

Collaborations

Throughout his career, Gabor has collaborated with esteemed colleagues such as Douglas K. Masnaghetti and Mehran Nasser-Ghodsi. These partnerships have expanded his research horizons and facilitated the development of cutting-edge technologies in the field.

Conclusion

Gabor D. Toth's contributions to charged particle microscopy exemplify how innovation can propel scientific understanding and technological advancements. With his impressive array of patents and collaborations in the industry, he remains a crucial figure in the evolution of imaging technologies, paving the way for future research and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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