Gilroy, CA, United States of America

Gabor D Toth


Average Co-Inventor Count = 3.4

ph-index = 9

Forward Citations = 226(Granted Patents)


Location History:

  • Gilroy, CA (US) (2017)
  • San Jose, CA (US) (2004 - 2021)

Company Filing History:


Years Active: 2004-2021

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22 patents (USPTO):Explore Patents

Title: The Innovations of Gabor D. Toth: Pioneering Advances in Charged Particle Microscopy

Introduction

Gabor D. Toth, an accomplished inventor based in Gilroy, CA, has made significant strides in the field of charged particle microscopy. Holding an impressive portfolio of 22 patents, his inventions are pivotal in enhancing imaging technologies used in various scientific applications.

Latest Patents

Among his notable patents is the "Method and system for charged particle microscopy with improved image beam stabilization and interrogation." This groundbreaking system features a scanning electron microscopy design that optimizes image beam stability. It incorporates an electron beam source to generate an electron beam, alongside a series of electron-optical elements directing the beam to the sample. Additionally, the system is equipped with an emittance analyzer assembly and a splitter element to manage secondary and backscattered electrons emitted from the sample's surface. This innovative design enables comprehensive imaging of these electrons, enhancing the quality and reliability of the resultant data.

Career Highlights

Gabor has contributed to the advancements in technology while working at prominent organizations, including KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His tenure at these companies has undoubtedly influenced his innovative approach to microscopy and imaging systems.

Collaborations

Throughout his career, Gabor has collaborated with esteemed colleagues such as Douglas K. Masnaghetti and Mehran Nasser-Ghodsi. These partnerships have expanded his research horizons and facilitated the development of cutting-edge technologies in the field.

Conclusion

Gabor D. Toth's contributions to charged particle microscopy exemplify how innovation can propel scientific understanding and technological advancements. With his impressive array of patents and collaborations in the industry, he remains a crucial figure in the evolution of imaging technologies, paving the way for future research and applications.

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