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For the Inventor, By the Inventor

Eindhoven, Netherlands

Faysal Boughorbel

This inventor holds 17 USPTO granted patents and 2 published patent applications and 12 EPO patents. Top assignees: Fei Comapny, Koninklijke Philips Corporation N.v., Other. Active years: 2012-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Faysal Boughorbel. Retrieved from https://idiyas.com/inventor/faysal-boughorbel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17 

% Patents Active = 94.1

 

Average Co-Inventor Count = 3.2

ph-index = 6

Forward Citations = 73(Granted Patents)


Company Filing History:

goldMedal15 out of 862 
 
Fei Comapny
 patents
silverMedal1 out of 21,894 
 
Koninklijke Philips Corporation N.v.
 patents
bronzeMedal1 out of 834,513 
Other
 patents

Years Active: 2012-2022

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17 patents (USPTO):Explore Patents
1. 11482400 - Method, device and system for remote deep learning for microscopic image reconstruction and segmentation (2022-10-25),
2. 10903043 - Method, device and system for remote deep learning for microscopic image reconstruction and segmentation (2021-01-26),
3. 10811223 - Method of analyzing surface modification of a specimen in a charged-particle microscope (2020-10-20),
4. 10545100 - X-ray imaging technique (2020-01-28),
5. 10128080 - Three-dimensional imaging in charged-particle microscopy (2018-11-13),
6. 10115561 - Method of analyzing surface modification of a specimen in a charged-particle microscope (2018-10-30),
7. 9934936 - Charged particle microscope with special aperture plate (2018-04-03),
8. 9711325 - Charged-particle microscope providing depth-resolved imagery (2017-07-18),
9. 9620330 - Mathematical image assembly in a scanning-type microscope (2017-04-11),
10. 9478393 - Computational scanning microscopy with improved resolution (2016-10-25),
11. 9312098 - Method of examining a sample in a charged-particle microscope (2016-04-12),
12. 8704176 - Charged particle microscope providing depth-resolved imagery (2014-04-22),
13. 8698078 - Charged-particle microscopy with occlusion detection (2014-04-15),
14. 8586921 - Charged-particle microscope providing depth-resolved imagery (2013-11-19),
15. 8581189 - Charged particle microscopy imaging method (2013-11-12),

Title: Faysal Boughorbel - Pioneering Inventor from Eindhoven

Introduction: Faysal Boughorbel is a renowned inventor based in Eindhoven, Netherlands, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Boughorbel's latest patents include cutting-edge developments in artificial intelligence, renewable energy systems, and sustainable transportation solutions.

Career Highlights: With a career spanning over two decades, Faysal Boughorbel has established himself as a leading figure in the tech industry, with a strong focus on creating solutions that address global challenges.

Collaborations: Throughout his career, Boughorbel has collaborated with top research institutions, leading companies, and innovative startups to bring his inventions to life and make a lasting impact on society.

Conclusion: Faysal Boughorbel's dedication to innovation and his passion for creating a better future through technology continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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