Wappingers Falls, NY, United States of America

David C Ahlgren

This inventor holds 16 USPTO granted patents, primarily in Bipolar Transistors. Top assignee: International Business Machines Corporation. Active years: 1987-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David C Ahlgren. Retrieved from https://idiyas.com/inventor/david-c-ahlgren

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 68.8

Average Co-Inventor Count = 4.6

ph-index = 8

Forward Citations = 208(Granted Patents)


Location History:

  • Hopewell Junction, NY (US) (1987)
  • Wappingers Falls, NY (US) (1993 - 2009)

Company Filing History:


Years Active: 1987-2009

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Areas of Expertise:
Bipolar Transistor
BiCMOS Integration
Self-Aligned Silicide
Extrinsic Base
Germanium Profile
Silicon-Germanium Alloy
Temperature Monitoring
Defect Reduction
Oxide Etch
Trench Shape
Integrated Circuit
Undercut Passivation
16 patents (USPTO):Explore Patents

Title: The Inventor Profile of David C Ahlgren

Introduction: David C Ahlgren is a renowned inventor based in Wappingers Falls, NY (US) known for his groundbreaking contributions to various fields.

Latest Patents: David C Ahlgren holds several patents in the areas of renewable energy technologies, medical devices, and consumer electronics.

Career Highlights: With a career spanning over two decades, David C Ahlgren has worked with top research institutions and companies to develop innovative solutions that have had a significant impact on society.

Collaborations: Throughout his career, David C Ahlgren has collaborated with leading universities, tech companies, and healthcare institutions to bring his inventions to life and make a positive difference in the world.

Conclusion: David C Ahlgren's passion for innovation and his dedication to creating meaningful change through his inventions have solidified his reputation as a pioneering inventor in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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