Company Filing History:

6 out of 1,787

Kla Tencor Corporation

patents

1 out of 641

Kla-tencor Technologies Corporation

Years Active: 2011-2021

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8 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 11114324 - Defect candidate generation for inspection (2021-09-07),

2. 10832396 - And noise based care areas (2020-11-10),

3. 9489599 - Decision tree construction for automatic classification of defects on semiconductor wafers (2016-11-08),

4. 8537349 - Monitoring of time-varying defect classification performance (2013-09-17),

5. 8135204 - Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe (2012-03-13),

6. 8126255 - Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions (2012-02-28),

7. 8073240 - Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer (2011-12-06),

8. 8000922 - Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm (2011-08-16),

Title: Innovations of Chris Maher

Introduction

Chris Maher is an accomplished inventor based in Campbell, California. He holds a total of eight patents, showcasing his expertise in developing advanced systems and methods for inspection technologies. His innovative contributions have significantly impacted the field of defect detection and inspection processes.

Latest Patents

Among his latest patents is a method for defect candidate generation for inspection. This system involves scanning a specimen and applying segmentation methods to the output generated during the scanning process. By detecting outliers in the segments, the method designates certain outliers as defect candidates based on predetermined criteria. Another notable patent focuses on noise-based care areas, which includes methods for setting up inspections with design and noise-based care areas. This system generates care areas for a specimen and separates them into different sub-groups based on statistically different output attributes.

Career Highlights

Chris Maher has worked with prominent companies such as KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in inspection technologies.

Collaborations

Throughout his career, Chris has collaborated with talented individuals, including Brian Duffy and Chien-Huei (Adam) Chen. These collaborations have fostered innovation and enhanced the development of his patented technologies.

Conclusion

Chris Maher is a notable inventor whose work in inspection technologies has led to multiple patents and significant advancements in the field. His innovative methods continue to influence the industry and improve defect detection processes.

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1 patent (EPO):

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3 patents pending (EPO):

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