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For the Inventor, By the Inventor

Los Altos, CA, United States of America

Carl Hess

This inventor holds 22 USPTO granted patents and 1 published patent application, primarily in Reticle Inspection. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation. Active years: 2008-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Carl Hess. Retrieved from https://idiyas.com/inventor/carl-hess

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 22 

% Patents Active = 95.5

Average Co-Inventor Count = 2.5

ph-index = 7

Forward Citations = 164(Granted Patents)


Company Filing History:

goldMedal15 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal7 out of 641 
 
Kla-Tencor Technologies Corporation
 patents

Years Active: 2008-2022

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Areas of Expertise:
Wafer Inspection
Reticle Inspection
Defect Classification
Process Monitoring
Metrological Analysis
Intensity Map Generation
Photomask Comparison
Design Defects
Simulation Methods
Optical Proximity Correction
High Bandwidth Transfer
Cell-to-Cell Inspection
22 patents (USPTO):Explore Patents
1. 11348222 - Methods and systems for inspection of wafers and reticles using designer intent data (2022-05-31),
2. 10713771 - Methods and systems for inspection of wafers and reticles using designer intent data (2020-07-14),
3. 10451563 - Inspection of photomasks by comparing two photomasks (2019-10-22),
4. 10401305 - Time-varying intensity map generation for reticles (2019-09-03),
5. 9778205 - Delta die and delta database inspection (2017-10-03),
6. 9710903 - System and method for detecting design and process defects on a wafer using process monitoring features (2017-07-18),
7. 9417191 - Using reflected and transmission maps to detect reticle degradation (2016-08-16),
8. 9390494 - Delta die intensity map measurement (2016-07-12),
9. 9208552 - Method and system for hybrid reticle inspection (2015-12-08),
10. 9002497 - Methods and systems for inspection of wafers and reticles using designer intent data (2015-04-07),
11. 8914754 - Database-driven cell-to-cell reticle inspection (2014-12-16),
12. 8810646 - Focus offset contamination inspection (2014-08-19),
13. 8204297 - Methods and systems for classifying defects detected on a reticle (2012-06-19),
14. 8165384 - Defect classification (2012-04-24),
15. 8151220 - Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout data (2012-04-03),

Title: Inventor Carl Hess: Revolutionizing Technology in Silicon Valley

Introduction: Carl Hess is a visionary inventor based in Los Altos, CA, known for his groundbreaking contributions to the tech industry.

Latest Patents: Carl Hess holds several patents in the fields of artificial intelligence, renewable energy, and biotechnology, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Carl Hess has worked for top tech companies in Silicon Valley, leading research and development teams to create cutting-edge solutions.

Collaborations: Throughout his career, Carl Hess has collaborated with renowned scientists, engineers, and researchers, fostering innovation and pushing the boundaries of technology.

Conclusion: Carl Hess continues to inspire the next generation of inventors with his passion for innovation and his relentless pursuit of technological advancement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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