Average Co-Inventor Count = 2.50
ph-index = 7
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Kla Tencor Corporation (15 from 1,787 patents)
2. Kla-tencor Technologies Corporation (7 from 641 patents)
22 patents:
1. 11348222 - Methods and systems for inspection of wafers and reticles using designer intent data
2. 10713771 - Methods and systems for inspection of wafers and reticles using designer intent data
3. 10451563 - Inspection of photomasks by comparing two photomasks
4. 10401305 - Time-varying intensity map generation for reticles
5. 9778205 - Delta die and delta database inspection
6. 9710903 - System and method for detecting design and process defects on a wafer using process monitoring features
7. 9417191 - Using reflected and transmission maps to detect reticle degradation
8. 9390494 - Delta die intensity map measurement
9. 9208552 - Method and system for hybrid reticle inspection
10. 9002497 - Methods and systems for inspection of wafers and reticles using designer intent data
11. 8914754 - Database-driven cell-to-cell reticle inspection
12. 8810646 - Focus offset contamination inspection
13. 8204297 - Methods and systems for classifying defects detected on a reticle
14. 8165384 - Defect classification
15. 8151220 - Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout data