The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Nov. 19, 2003
Applicants:
Weimin MA, Fremont, CA (US);
Carl E. Hess, Los Altos, CA (US);
Inventors:
Weimin Ma, Fremont, CA (US);
Carl E. Hess, Los Altos, CA (US);
Assignee:
KLA-Tencor Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for classifying images from a set of test images, including comparing each of the test images to reference images. Each of the test images is grouped with one of the reference images. All of the images in each group can be classified with a single classification.
Quick Actions:
Ma, Weimin. (2012). Defect classification (U.S. Patent No. 8165384). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8165384
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile