Brian Duffy

This inventor holds 35 USPTO granted patents and 3 published patent applications and 4 EPO patents, primarily in Semiconductor Inspection. Top assignees: Kla Tencor Corporation, Kla Corporation, Kla-Tencor Technologies Corporation. Active years: 2004-2025.

USPTO Granted Patents = 35 (Patent Applications = 3)

% Patents Active = 100.0

EPO Patents = 4 (Patent Applications = 7)

Average Co-Inventor Count = 3.4

ph-index = 11

Forward Citations = 806(Granted Patents)

Company Filing History:

26 out of 1,787

Kla Tencor Corporation

Kla-Tencor Technologies Corporation

patents

4. 1 out of 4

Hpl Technologies, Inc.

patents

Years Active: 2004-2025

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Areas of Expertise:

Deep Learning

Defect Detection

Virtual Inspection

Semiconductor Applications

Automated Measurement

Pattern Fidelity

Inspection Systems

Training Model

Fault Inference

Image Generation

Process Window

Defect Classification

35 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12480890 - Deep learning based mode selection for inspection (2025-11-25),

2. 11922619 - Context-based defect inspection (2024-03-05),

3. 11769242 - Mode selection and defect detection training (2023-09-26),

4. 11580375 - Accelerated training of a machine learning based model for semiconductor applications (2023-02-14),

5. 11415526 - Multi-controller inspection system (2022-08-16),

6. 10832396 - And noise based care areas (2020-11-10),

7. 10769761 - Generating high resolution images from low resolution images for semiconductor applications (2020-09-08),

8. 10713769 - Active learning for defect classifier training (2020-07-14),

9. 10699926 - Identifying nuisances and defects of interest in defects detected on a wafer (2020-06-30),

10. 10670535 - Automated pattern fidelity measurement plan generation (2020-06-02),

11. 10551827 - Hybrid inspection system for efficient process window discovery (2020-02-04),

12. 10539612 - Voltage contrast based fault and defect inference in logic chips (2020-01-21),

13. 10496781 - Metrology recipe generation using predicted metrology images (2019-12-03),

14. 10416088 - Virtual inspection systems with multiple modes (2019-09-17),

15. 10402461 - Virtual inspection systems for process window characterization (2019-09-03),

Title: The Innovative Journey of Brian Duffy

Introduction:

Brian Duffy, a visionary inventor based in San Jose, CA, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents:

Brian Duffy's latest patents include a cutting-edge artificial intelligence algorithm for predictive analytics in healthcare, a revolutionary renewable energy storage system, and a state-of-the-art cybersecurity software for data protection.

Career Highlights:

With a career spanning over two decades, Brian Duffy has established himself as a leading figure in the tech industry. His innovative solutions have garnered international recognition and have been instrumental in shaping the future of various sectors.

Collaborations:

Throughout his career, Brian Duffy has collaborated with top research institutions, leading tech companies, and renowned universities to further advance his inventions. His ability to work across disciplines has led to the development of groundbreaking technologies.

Conclusion:

In conclusion, Brian Duffy's relentless pursuit of innovation and his passion for creating solutions to complex challenges have solidified his position as a trailblazing inventor in the tech world. His work continues to inspire future generations of inventors and innovators.