Atsushi Takane

This inventor holds 43 USPTO granted patents and 1 published patent application and 3 EPO patents, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi Medical Corporation. Active years: 1992-2013.

USPTO Granted Patents = 43 (Patent Applications = 1)

% Patents Active = 67.4

EPO Patents = 3 (Patent Applications = 1)

Average Co-Inventor Count = 4.7

ph-index = 10

Forward Citations = 389(Granted Patents)

Location History:

Katsuta, JP (1992 - 1995)
Ibaraki, JP (2004)
Mito, JP (2003 - 2013)

Company Filing History:

24 out of 2,874

Hitachi-High-Technologies Corporation

Hitachi Medical Corporation

patents

4. 1 out of 33

Hitachi-Science Systems, Ltd.

patents

where one patent can have more than one assignee

Years Active: 1992-2013

Loading Chart...

Areas of Expertise:

Charged Particle Beam

Microscopy

Image Evaluation

Defect Inspection

Scanning Electron Microscope

Semiconductor Inspection

Dimension Measurement

Pattern Matching

Image Formation

Sample Image

Alignment Method

Shape Measurement

43 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8558999 - Defect inspection apparatus and method utilizing multiple inspection conditions (2013-10-15),

2. 8335397 - Charged particle beam apparatus (2012-12-18),

3. 8304722 - Charged particle beam equipment and charged particle microscopy (2012-11-06),

4. 8263935 - Charged particle beam apparatus (2012-09-11),

5. 8041104 - Pattern matching apparatus and scanning electron microscope using the same (2011-10-18),

6. 8030614 - Charged particle beam apparatus and dimension measuring method (2011-10-04),

7. 8026491 - Charged particle beam apparatus and method for charged particle beam adjustment (2011-09-27),

8. 7973282 - Charged particle beam apparatus and dimension measuring method (2011-07-05),

9. 7923701 - Charged particle beam equipment (2011-04-12),

10. 7805023 - Image evaluation method and microscope (2010-09-28),

11. 7800059 - Method of forming a sample image and charged particle beam apparatus (2010-09-21),

12. 7652249 - Charged particle beam apparatus (2010-01-26),

13. 7642514 - Charged particle beam apparatus (2010-01-05),

14. 7633063 - Charged particle beam apparatus (2009-12-15),

15. 7605381 - Charged particle beam alignment method and charged particle beam apparatus (2009-10-20),

Title: The Innovative Journey of Atsushi Takane

Introduction:

Atsushi Takane is a renowned inventor hailing from Mito, Japan. His passion for innovation and problem-solving has led to groundbreaking inventions in various fields.

Latest Patents:

Atsushi Takane's latest patents include cutting-edge technologies in the automotive industry, focusing on enhancing safety features and improving overall driving experience.

Career Highlights:

With a career spanning over two decades, Atsushi Takane has established himself as a pioneer in the field of robotics and automation. His contributions to the development of advanced robotics systems have revolutionized industries worldwide.

Collaborations:

Atsushi Takane has collaborated with leading research institutions and universities to further his research and bring his inventions to life. His collaborative efforts have resulted in the creation of cutting-edge technologies that have a lasting impact on society.

Conclusion:

In conclusion, Atsushi Takane's relentless pursuit of innovation and his dedication to pushing the boundaries of technology have solidified his position as a visionary inventor in the global innovation landscape. His work continues to inspire future generations of inventors and innovators.