The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Aug. 22, 2005
Applicants:

Yasutaka Toyoda, Hitachi, JP;

Mitsuji Ikeda, Hitachinaka, JP;

Atsushi Takane, Mito, JP;

Inventors:

Yasutaka Toyoda, Hitachi, JP;

Mitsuji Ikeda, Hitachinaka, JP;

Atsushi Takane, Mito, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A pattern matching apparatus comprising: means for storing photographed image data of a semiconductor device; means for storing CAD data of said semiconductor device; an information input means for inputting information on the white band width contained in said image data; a pattern extracting means for extracting a pattern on the semiconductor device from said image data by using the white band width information; and a matching means for matching said pattern with the CAD data.


Find Patent Forward Citations

Toyoda, Yasutaka. (2011). Pattern matching apparatus and scanning electron microscope using the same (U.S. Patent No. 8041104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8041104

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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