The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
May. 21, 2007
Tohru Ishitani, Hitachinaka, JP;
Mitsugu Sato, Hitachinaka, JP;
Hideo Todokoro, Nishitama, JP;
Tadashi Otaka, Hitachinaka, JP;
Takashi Iizumi, Hitachinaka, JP;
Atsushi Takane, Mito, JP;
Tohru Ishitani, Hitachinaka, JP;
Mitsugu Sato, Hitachinaka, JP;
Hideo Todokoro, Nishitama, JP;
Tadashi Otaka, Hitachinaka, JP;
Takashi Iizumi, Hitachinaka, JP;
Atsushi Takane, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Image evaluation method capable of objectively evaluating the image resolution of a microscope image. An image resolution method is characterized in that resolution in partial regions of an image is obtained over an entire area of the image or a portion of the image, averaging is performed over the entire area of the image or the portion of the image, and the averaged value is established as the resolution evaluation value of the entire area of the image or the portion of the image. This method eliminates the subjective impressions of the evaluator from evaluation of microscope image resolution, so image resolution evaluation values of high accuracy and good repeatability can be obtained.