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For the Inventor, By the Inventor

Hitachinaka, Japan

Takashi Iizumi

This inventor holds 29 USPTO granted patents and 1 EPO patent, primarily in Scanning Electron Microscopy. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation. Active years: 1990-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Iizumi. Retrieved from https://idiyas.com/inventor/takashi-iizumi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29

% Patents Active = 51.7


Average Co-Inventor Count = 4.8

ph-index = 8

Forward Citations = 183(Granted Patents)


Location History:

  • Kawasaki, JP (1990)
  • Hitachinaka, JP (2003 - 2014)

Company Filing History:

goldMedal19 out of 42,740 
 
Hitachi, Ltd.
 patents
silverMedal10 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents

Years Active: 1990-2014

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Areas of Expertise:
Scanning Electron Microscope
Image Evaluation
Remote Maintenance
Sample Dimension Measurement
Charged Particle Beam
Circuit Pattern Inspection
Image Correction
Semiconductor Device Monitoring
29 patents (USPTO):Explore Patents
1. 8666165 - Scanning electron microscope (2014-03-04),
2. 7910886 - Sample dimension measuring method and scanning electron microscope (2011-03-22),
3. 7849304 - System and method for on-line diagnostics (2010-12-07),
4. 7805023 - Image evaluation method and microscope (2010-09-28),
5. 7800059 - Method of forming a sample image and charged particle beam apparatus (2010-09-21),
6. 7551976 - Industrial device receiving remote maintenance operation and outputting charge information (2009-06-23),
7. 7439505 - Scanning electron microscope (2008-10-21),
8. 7433542 - Method for measuring line and space pattern using scanning electron microscope (2008-10-07),
9. 7373501 - System and method for on-line diagnostics (2008-05-13),
10. 7372047 - Charged particle system and a method for measuring image magnification (2008-05-13),
11. 7369703 - Method and apparatus for circuit pattern inspection (2008-05-06),
12. 7361894 - Method of forming a sample image and charged particle beam apparatus (2008-04-22),
13. 7340111 - Image evaluation method and microscope (2008-03-04),
14. 7285777 - Sample dimension measuring method and scanning electron microscope (2007-10-23),
15. 7236651 - Image evaluation method and microscope (2007-06-26),

Title: Takashi Iizumi - Innovative Inventor from Hitachinaka

Introduction: Takashi Iizumi is a renowned inventor hailing from Hitachinaka, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takashi Iizumi holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his diverse range of expertise and creativity.

Career Highlights: With over two decades of experience in the industry, Takashi Iizumi has worked with leading tech companies to develop cutting-edge solutions that have revolutionized various sectors.

Collaborations: Throughout his career, Takashi Iizumi has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and knowledge sharing.

Conclusion: Takashi Iizumi's passion for pushing the boundaries of technology and his relentless pursuit of excellence make him a true pioneer in the world of inventions and innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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