Atsuko Takafuji

This inventor holds 37 USPTO granted patents, primarily in Electron Beam Inspection. Top assignees: Hitachi, Ltd., Hitachi Medical Corporation. Active years: 1995-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsuko Takafuji. Retrieved from https://idiyas.com/inventor/atsuko-takafuji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 37

% Patents Active = 56.8

Average Co-Inventor Count = 8.9

ph-index = 13

Forward Citations = 579(Granted Patents)

Location History:

Tokyo, JP (1995 - 2011)
Nerima-ku, JP (2000 - 2013)

Company Filing History:

Hitachi Medical Corporation

patents

where one patent can have more than one assignee

Years Active: 1995-2013

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Areas of Expertise:

Electron Beam

Integrated Circuit

Charged Particle Beam

Pattern Inspection

Wafer Inspection

Astigmatism Adjustment

Calibration

Substrate

Semiconductor Fabrication

Inspection System

Microtron Accelerator

X-ray Computed Tomography

37 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8604430 - Method and an apparatus of an inspection system using an electron beam (2013-12-10),

2. 8134125 - Method and apparatus of an inspection system using an electron beam (2012-03-13),

3. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),

4. 7439506 - Method and an apparatus of an inspection system using an electron beam (2008-10-21),

5. 7439504 - Pattern inspection method and apparatus using electron beam (2008-10-21),

6. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),

7. 7397031 - Method of inspecting a circuit pattern and inspecting instrument (2008-07-08),

8. 7348558 - Charged particle beam apparatus and automatic astigmatism adjustment method (2008-03-25),

9. 7242015 - Patterned wafer inspection method and apparatus therefor (2007-07-10),

10. 7232996 - Method and an apparatus of an inspection system using an electron beam (2007-06-19),

11. 7098455 - Method of inspecting a circuit pattern and inspecting instrument (2006-08-29),

12. 7030394 - Charged particle beam apparatus and automatic astigmatism adjustment method (2006-04-18),

13. 7026830 - Method and apparatus for inspecting integrated circuit pattern (2006-04-11),

14. 7012252 - Method and an apparatus of an inspection system using an electron beam (2006-03-14),

15. 6987265 - Method and an apparatus of an inspection system using an electron beam (2006-01-17),

Title: The Innovative Journey of Atsuko Takafuji

Introduction: Atsuko Takafuji is a pioneering inventor hailing from Tokyo, Japan. Her groundbreaking work in the field of technology has significantly impacted various industries worldwide.

Latest Patents: Atsuko Takafuji holds several patents in the areas of artificial intelligence, robotics, and sustainable energy solutions. Her most recent patents focus on enhancing efficiency in manufacturing processes through the integration of smart technologies.

Career Highlights: With a career spanning over two decades, Atsuko Takafuji has worked with leading tech companies in Japan, spearheading research and development projects that have led to the creation of cutting-edge products. Her innovative solutions have earned her recognition as a trailblazer in the tech industry.

Collaborations: Atsuko Takafuji has collaborated with top research institutions and universities in Japan to further her research and bring her inventions to life. Her partnerships have been instrumental in pushing the boundaries of technological advancements and driving innovation forward.

Conclusion: Atsuko Takafuji's dedication to innovation and her relentless pursuit of excellence have solidified her reputation as a visionary inventor. Her contributions to the world of technology continue to inspire future generations of inventors and shape the landscape of innovation globally.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]