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For the Inventor, By the Inventor

Berkeley, CA, United States of America

Anish Mittal

USPTO Granted Patents = 47 

 

Average Co-Inventor Count = 3.0

ph-index = 6

Forward Citations = 118(Granted Patents)


Location History:

  • Berkeley, CA (US) (2016 - 2023)
  • San Francisco, CA (US) (2021 - 2023)

Company Filing History:

goldMedal46 out of 1,626 
 
Here Global B.v.
 patents
silverMedal1 out of 5,684 
 
Nokia Technologies Oy
 patents

Years Active: 2016-2023

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Areas of Expertise:
Pose Refinement
Polyline Homogeneity
Mapping Information
Image Labeling
Feature Detection
Machine Learning Models
Ground Control Points
Feature Correspondence
Object Detection
Lane Prediction
Image Segmentation
Quality Assessment
47 patents (USPTO):Explore Patents
1. 11699246 - Systems and methods for validating drive pose refinement (2023-07-11),
2. 11580755 - Method, apparatus, and system for determining polyline homogeneity (2023-02-14),
3. 11549816 - Systems and methods for controlling mapping information inaccuracies (2023-01-10),
4. 11544950 - Method and apparatus for updating road map geometry based on received probe data (2023-01-03),
5. 11501104 - Method, apparatus, and system for providing image labeling for cross view alignment (2022-11-15),
6. 11449768 - Method, apparatus, and system for providing a redundant feature detection engine (2022-09-20),
7. 11448512 - Systems and methods for verifying mapping information (2022-09-20),
8. 11410074 - Method, apparatus, and system for providing a location-aware evaluation of a machine learning model (2022-08-09),
9. 11295519 - Method for determining polygons that overlap with a candidate polygon or point (2022-04-05),
10. 11263726 - Method, apparatus, and system for task driven approaches to super resolution (2022-03-01),
11. 11250051 - Method, apparatus, and system for predicting a pose error for a sensor system (2022-02-15),
12. 11215462 - Method, apparatus, and system for location correction based on feature point correspondence (2022-01-04),
13. 11182607 - Method, apparatus, and system for determining a ground control point from image data using machine learning (2021-11-23),
14. 11170485 - Method, apparatus, and system for automatic quality assessment of cross view feature correspondences using bundle adjustment techniques (2021-11-09),
15. 11113839 - Method, apparatus, and system for feature point detection (2021-09-07),

Title: The Innovative Journey of Anish Mittal

Introduction: Anish Mittal, a visionary inventor based in Berkeley, CA, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents: Anish Mittal's latest patents showcase his expertise in areas such as artificial intelligence, renewable energy, and biotechnology, demonstrating his commitment to creating solutions for the future.

Career Highlights: With a career spanning over two decades, Anish Mittal has established himself as a leading figure in the tech industry, having worked with renowned companies and research institutions to bring his ideas to life.

Collaborations: Anish Mittal has collaborated with top universities and research institutions worldwide, fostering a culture of innovation and knowledge-sharing to drive progress in various technological domains.

Conclusion: Anish Mittal's relentless pursuit of innovation and his passion for creating a positive impact on society through his inventions make him a true pioneer in the world of technology.

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