The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2021
Filed:
Feb. 26, 2019
Applicant:
Here Global B.v., Eindhoven, NL;
Inventors:
Anish Mittal, San Francisco, CA (US);
Zhanwei Chen, Richmond, CA (US);
Assignee:
HERE Global B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/50 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 2207/20021 (2013.01); G06T 2207/20084 (2013.01);
Abstract
An approach is provided for feature point detection and representation. The approach, for example, involves processing (e.g., using a neural network or equivalent) image data associated with a grid cell of an image to determine a feature point corresponding to a position of a feature detected in the image data. The approach also involves encoding the position of the feature with respect to a coordinate system referenced to the grid cell. The output comprises one or more parameters indicating the encoded position, one or more attributes of the feature, or a combination thereof.