The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Jul. 31, 2019
Applicant:

Here Global B.v, Eindhoven, NL;

Inventors:

David Lawlor, Chicago, IL (US);

Zhanwei Chen, Xihua, CN;

Anish Mittal, San Francisco, CA (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/32 (2006.01); G01C 21/36 (2006.01); G06N 20/00 (2019.01); G06V 10/20 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G01C 21/32 (2013.01); G01C 21/3638 (2013.01); G06N 20/00 (2019.01); G06V 10/255 (2022.01); G06V 20/588 (2022.01);
Abstract

Systems and methods for correcting mapping information inaccuracies are described. In some aspects, the method includes receiving terrestrial data captured in an area of interest, and detecting features in the terrestrial data identifying ground points in the area of interest. The method also includes correlating the ground points with ground control points in the area of interest to determine a correspondence, and computing an aggregate of positional differences between corresponding points. The method further includes generating a report indicating a quality of the terrestrial data captured in the area of interest based on the aggregate.


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