The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Dec. 14, 2017
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Richard Kwant, Oakland, CA (US);

Anish Mittal, Berkeley, CA (US);

David Lawlor, Chicago, IL (US);

Zhanwei Chen, Oakland, CA (US);

Himaanshu Gupta, San Francisco, CA (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/29 (2019.01); G06F 16/909 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/29 (2019.01); G06F 16/909 (2019.01);
Abstract

An approach is provided for a location-aware evaluation of a machine learning model. The approach, for example, involves designating a geographic area for creating an evaluation dataset for the machine learning model. The approach also involves separating a plurality of observation data records into the evaluation dataset and a training dataset based on a comparison of a respective data collection location of each of the plurality of observation data records to the geographic area. The training dataset is then used to train the machine learning model, and the evaluation dataset is used to evaluate the trained machine learning model.


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