The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Sep. 24, 2020
Here Global B.v., Eindhoven, NL;
Anish Mittal, Berkeley, CA (US);
Mark David Tabb, San Francisco, CA (US);
Himaanshu Gupta, Emeryville, CA (US);
Yelena Perelmutova, Berkeley, CA (US);
David Lawlor, Veldhoven, NL;
HERE GLOBAL B.V., Eindhoven, NL;
Abstract
A method is provided for generating and revising map geometry based on a received image and probe data. A method may include: receiving probe data from a first period of time, where the probe data from a first period of time is from a plurality of probes within a predefined geographic region; generating a first image of the predefined geographic region based on the probe data from the first period of time; receiving probe data from a second period of time different from the first period of time, where the probe data from the second period of time is from a plurality of probes within the predefined geographic region; generating a second image based on the probe data from the second period of time; comparing the first image to the second image; and generating a revised route geometry based on changes detected between the first image and the second image.