The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Oct. 26, 2018
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Anish Mittal, San Francisco, CA (US);

Zhanwei Chen, Richmond, CA (US);

David Lawlor, Chicago, IL (US);

Peter Christian, Chicago, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/32 (2006.01); G06T 7/73 (2017.01); G06F 16/29 (2019.01);
U.S. Cl.
CPC ...
G01C 21/32 (2013.01); G06F 16/29 (2019.01); G06T 7/74 (2017.01); G06T 2207/30244 (2013.01);
Abstract

An approach is provided for location correction using feature point correspondences between images or image sources. The approach, for example, involves processing a first image and a second image to identify a feature that is visible in both the first image and the second image. The first image has an image-to-ground correspondence between the feature in the first image and a geographic location. The approach also involves transferring the image-to-ground correspondence from the first image to the second image. The approach further involves using the transferred image-to-ground correspondence to reference the feature in the second image to the geographic location.


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