The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Apr. 06, 2020
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Jeff Connell, Walnut Creek, CA (US);

Anish Mittal, San Francisco, CA (US);

David Johnston Lawlor, Evanston, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/25 (2022.01); G01C 21/32 (2006.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G01C 21/32 (2013.01); G06V 10/25 (2022.01); G06V 20/13 (2022.01);
Abstract

Systems and methods for verifying mapping information are provided. In some aspects, a method includes receiving control data acquired in an area of interest, the control data comprising a plurality of control points, and receiving mapping data associated with the area of interest, the mapping data comprising a plurality of mapping points that correspond to the plurality control points. The method also includes applying a localization algorithm to the control data to generate a control track, and applying the localization algorithm to the mapping data to generate a mapping track. The method further includes comparing the control track and the mapping track to determine a difference.


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