Walnut Creek, CA, United States of America

Jeff Connell


 

Average Co-Inventor Count = 2.8

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Chicago, IL (US) (2021)
  • Walnut Creek, CA (US) (2021 - 2022)

Company Filing History:


Years Active: 2021-2022

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4 patents (USPTO):

Title: Innovations by Jeff Connell

Introduction

Jeff Connell is an accomplished inventor based in Walnut Creek, California. He has made significant contributions to the field of mapping technologies, holding a total of four patents. His work focuses on systems and methods that enhance the accuracy and reliability of mapping information.

Latest Patents

Connell's latest patents include "Systems and methods for verifying mapping information." This patent outlines a method that involves receiving control data and mapping data associated with an area of interest. The method applies a localization algorithm to both data sets to generate control and mapping tracks, which are then compared to identify differences. Another notable patent is "Systems and methods for identifying data suitable for mapping." This invention describes a process for selecting ground control points from images and determining their perceived locations. By computing pairwise distances between perceived and predetermined locations, the method assesses the suitability of images for mapping purposes.

Career Highlights

Connell's career is marked by his innovative approach to solving complex mapping challenges. His work at Here Global B.V. has positioned him as a key player in the development of advanced mapping technologies. His patents reflect a deep understanding of both theoretical and practical aspects of mapping systems.

Collaborations

Connell has collaborated with notable colleagues, including Anish Mittal and David Johnston Lawlor. These partnerships have contributed to the advancement of mapping technologies and have fostered a collaborative environment for innovation.

Conclusion

Jeff Connell's contributions to mapping technologies through his patents demonstrate his expertise and commitment to innovation. His work continues to influence the field and improve the accuracy of mapping systems.

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