The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Feb. 27, 2020
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Jeff Connell, Walnut Creek, CA (US);

Anish Mittal, San Francisco, CA (US);

David Johnston Lawlor, Evanston, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/70 (2017.01); G06F 16/29 (2019.01); G06F 16/587 (2019.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G06F 16/29 (2019.01); G06F 16/587 (2019.01); G06T 2207/20081 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Systems and methods for identifying data suitable for mapping are provided. In some aspects, the method includes receiving one or more images acquired in an area of interest, and selecting at least two ground control points within a field of view of the one or more images. The method also includes determining perceived locations for the at least two ground control points using the one or more images, and computing pairwise distances between the perceived locations and predetermined locations of the at least two ground control points. The method further includes comparing corresponding pairwise distances to identify differences therebetween, and determining a suitability of the one or more images for mapping based on the comparison.


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