The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Jul. 25, 2019
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Richard Kwant, Oakland, CA (US);

Anish Mittal, Berkeley, CA (US);

David Lawlor, Chicago, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/05 (2011.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 17/05 (2013.01); G06T 17/20 (2013.01); G06T 2210/12 (2013.01); G06T 2210/21 (2013.01);
Abstract

An approach is provided for determining a polygon of a geographic database that overlaps a candidate polygon or candidate point. The geographic database represents stored polygons as respective polygon points with zero area. The approach involves determining proximate polygon points from among the respective polygon points with zero area that are within a distance threshold of the candidate polygon or the candidate point. The approach also involves retrieving one or more proximate polygons from the geographic database that correspond to the one or more proximate polygon points. The approach further involves determining an intersection between the one or more proximate polygons and the candidate polygon or the candidate point. The approach then involves selecting the polygon that overlaps the candidate polygon or the candidate point based on the determined intersection.


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