The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Oct. 26, 2018
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Nicholas Pojman, San Francisco, CA (US);

Anish Mittal, San Francisco, CA (US);

Zhanwei Chen, Richmond, CA (US);

David Lawlor, Chicago, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 9/44 (2018.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00536 (2013.01); G06F 9/44 (2013.01); G06K 9/0063 (2013.01); G06K 9/00476 (2013.01); G06K 2009/2045 (2013.01);
Abstract

An approach is provided for determining a ground control point from image data using machine learning. The approach, for example, involves selecting an feature based determining that the feature meets one or more properties for classification as a machine learnable feature. The approach also involves retrieving a plurality of ground truth images depicting the feature. The plurality of ground truth images is labeled with known pixel location data of the feature as respectively depicted in each of the plurality of ground truth images. The approach further involves training a machine learning model using the plurality of ground truth images to identify predicted pixel location data of the ground control point as depicted in an input image.


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