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For the Inventor, By the Inventor

Fremont, CA, United States of America

Andrew W Lai

USPTO Granted Patents = 13

Average Co-Inventor Count = 1.7

ph-index = 8

Forward Citations = 127(Granted Patents)


Company Filing History:

goldMedal13 out of 5,008 
 
Xilinx, Inc.
 patents

Years Active: 2004-2014

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13 patents (USPTO):Explore Patents
1. 8633722 - Method and circuit for testing accuracy of delay circuitry (2014-01-21),
2. 8327201 - Parallel testing of an integrated circuit that includes multiple dies (2012-12-04),
3. 7728604 - Testing differential signal standards using device under test's built in resistors (2010-06-01),
4. 7724030 - Method and apparatus for providing a feedback path for an output signal (2010-05-25),
5. 7685486 - Testing of an embedded multiplexer having a plurality of inputs (2010-03-23),
6. 7583102 - Testing of input/output devices of an integrated circuit (2009-09-01),
7. 7219314 - Application-specific methods for testing molectronic or nanoscale devices (2007-05-15),
8. 7187199 - Structures and methods for testing programmable logic devices having mixed-fabric architectures (2007-03-06),
9. 7007250 - Application-specific methods useful for testing look up tables in programmable logic devices (2006-02-28),
10. 6944836 - Structures and methods for testing programmable logic devices having mixed-fabric architectures (2005-09-13),
11. 6944809 - Methods of resource optimization in programmable logic devices to reduce test time (2005-09-13),
12. 6876218 - Method for accurate output voltage testing (2005-04-05),
13. 6732309 - Method for testing faults in a programmable logic device (2004-05-04),

Title: Innovations by Andrew W Lai

Introduction

Andrew W Lai is a prominent inventor based in Fremont, CA, known for his significant contributions to the field of integrated circuit testing. With a total of 13 patents to his name, he has developed innovative methods that enhance the accuracy and efficiency of electronic testing processes.

Latest Patents

One of his latest patents is titled "Method and circuit for testing accuracy of delay circuitry." This invention provides a circuit for testing delays by utilizing a test signal generator that toggles multiple output signals in a sequential manner, allowing for precise measurement of delay circuits. Another notable patent is "Parallel testing of an integrated circuit that includes multiple dies." This method involves a master die receiving configuration data and broadcasting it to slave dies, enabling efficient testing across multiple components of an integrated circuit.

Career Highlights

Andrew W Lai is currently employed at Xilinx, Inc., where he continues to push the boundaries of innovation in integrated circuit technology. His work has been instrumental in developing advanced testing methodologies that are crucial for the reliability of electronic devices.

Collaborations

Throughout his career, Andrew has collaborated with talented professionals, including Tuyet Ngoc Simmons and Shekhar Bapat, contributing to a dynamic and innovative work environment.

Conclusion

Andrew W Lai's contributions to the field of integrated circuits and testing methodologies exemplify the spirit of innovation. His patents not only reflect his expertise but also pave the way for advancements in electronic testing technology.

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