The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2004

Filed:

Aug. 02, 2001
Applicant:
Inventors:

Shahin Toutounchi, Pleasanton, CA (US);

Andrew W. Lai, Fremont, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

A new method to test short faults in a programmable logic device is described. The line segments under test are connected together to form a conducting chain. All the line segments neighboring to the conducting chain are tied to a known state. A test vector is applied to the programmable logic device. The state of the line under test is measured. If it is the same as the known state, the programmable logic device is likely to have faults.


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