The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
May. 05, 2010
Andrew W. Lai, Fremont, CA (US);
Andrew W. Lai, Fremont, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A method of testing an integrated circuit (IC) having a plurality of dies can include receiving, within a master die of the plurality of dies of the IC, a configuration data set specifying a circuit design, wherein the circuit design is instantiated within the master die. The method can include broadcasting the configuration data set to at least one slave die, wherein the circuit design is instantiated within each slave die and receiving, within the master die, a test vector set. The method also can include broadcasting the test vector set to the at least one slave die and responsive to each die executing the test vector set, storing test output data generated by each die.