The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Feb. 14, 2003
Tuyet Ngoc Simmons, Los Gatos, CA (US);
Andrew W. Lai, Fremont, CA (US);
Tuyet Ngoc Simmons, Los Gatos, CA (US);
Andrew W. Lai, Fremont, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A method for accurate testing of the output voltage of an integrated circuit comprises enabling a differential voltage comparator on the integrated circuit to be tested. One input to the differential comparator is set to a reference voltage, and the other input is coupled to a node to be tested. A current load is injected at the node, and the output of the voltage comparator can be used to determine if the integrated circuit performs within the specifications set by a manufacturer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile