Ballston Lake, NY, United States of America

Alok Vaid

USPTO Granted Patents = 20 (Patent Applications = 8)

Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 35(Granted Patents)

Location History:

Beacon, NY (US) (2010 - 2012)
Halfmoon, NY (US) (2021)
Clifton Park, NY (US) (2020 - 2022)
Ballston Lake, NY (US) (2014 - 2024)

Company Filing History:

International Business Machines Corporation

patents

3 out of 188

Nova Measuring Instruments Ltd.

patents

4. 2 out of 12,883

Advanced Micro Devices Corporation

Globalfoundries U.S. Inc.

patents

where one patent can have more than one assignee

Years Active: 2010-2024

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20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11906451 - Method and system for non-destructive metrology of thin layers (2024-02-20),

2. 11300948 - Process control of semiconductor fabrication based on spectra quality metrics (2022-04-12),

3. 10976666 - Apparatus and related method to control radiation transmission through mask pattern (2021-04-13),

4. 10664638 - Measuring complex structures in semiconductor fabrication (2020-05-26),

5. 10508900 - Three-dimensional scatterometry for measuring dielectric thickness (2019-12-17),

6. 10302414 - Scatterometry method and system (2019-05-28),

7. 10121711 - Planar metrology pad adjacent a set of fins of a fin field effect transistor device (2018-11-06),

8. 10030971 - Measurement system and method for measuring in thin films (2018-07-24),

9. 9995692 - Systems and methods of controlling a manufacturing process for a microelectronic component (2018-06-12),

10. 9903707 - Three-dimensional scatterometry for measuring dielectric thickness (2018-02-27),

11. 9330985 - Automated hybrid metrology for semiconductor device fabrication (2016-05-03),

12. 9281249 - Decoupling measurement of layer thicknesses of a plurality of layers of a circuit structure (2016-03-08),

13. 9177873 - Systems and methods for fabricating semiconductor device structures (2015-11-03),

14. 9129905 - Planar metrology pad adjacent a set of fins of a fin field effect transistor device (2015-09-08),

15. 9121890 - Planar metrology pad adjacent a set of fins of a fin field effect transistor device (2015-09-01),

Title: The Innovative Journey of Alok Vaid

Introduction: Alok Vaid, a talented inventor hailing from Ballston Lake, NY, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Alok Vaid's latest patents include advancements in artificial intelligence algorithms for autonomous vehicles and cutting-edge medical devices for remote patient monitoring.

Career Highlights: With a career spanning over two decades, Alok Vaid has worked with top research institutions and leading tech companies to bring his ideas to life. His expertise in software development and engineering has led to the successful commercialization of several products.

Collaborations: Alok Vaid has collaborated with renowned universities and medical centers to integrate his inventions into real-world applications. His partnerships have resulted in life-changing solutions for various industries.

Conclusion: Alok Vaid's passion for innovation and dedication to improving lives through technology make him a standout figure in the world of inventors. His relentless pursuit of excellence continues to inspire future generations of innovators.

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8 patents pending:

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