Chu-Pei, Taiwan

Yield Microelectronics Corp.


USPTO Granted Patents = 28

% Expired Patents = 3.6

Forward Citations = 101

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24 inventors (with patents filed for the assignee):

goldMedal Wen-Chien Huang (15 out of 15 patents)

silverMedal Hsin-Chang Lin (9 out of 11 patents)

bronzeMedal Ya-Ting Fan (8 out of 8 patents)

4.  Cheng-Ying Wu (6 out of 6 patents)

5.  Hsin Chang Lin (6 out of 7 patents)

6.  Chia-Hao Tai (5 out of 5 patents)

7.  Yu Ting Huang (5 out of 6 patents)

8.  Chi Pei Wu (5 out of 5 patents)

9.  Cheng-Yu Chung (4 out of 4 patents)

10.  Ming-Tsang Yang (4 out of 4 patents)

11.  Chi-pei Wu (4 out of 4 patents)

12.  Yu-ting Huang (4 out of 4 patents)

13.  Yang-Sen Yen (3 out of 3 patents)

14.  Yu-Ting Huang (2 out of 2 patents)

15.  Yang-Sen Yeh (2 out of 2 patents)


Core Competencies:
Non-Volatile Memory
EEPROM Array
Anti-Fuse
High-Speed Memory
Low-Voltage
Memory Array
Writing Rate
Charge Pump
Single-Gate
Fast Erasing
Common-Voltage
Low-Cost

28 patents:

Company Overview
Yield Microelectronics Corp. is a technology company based in Chu-Pei, Taiwan, specializing in advanced semiconductor solutions. The organization focuses on developing innovative microelectronic components and systems that enhance performance and efficiency across various applications. With a strong emphasis on research and development, Yield Microelectronics is dedicated to pushing the boundaries of technology in the semiconductor industry, contributing to advancements in areas such as consumer electronics, automotive systems, and industrial automation.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

28 Patents

#2 in Chu-Pei

#621 in Taiwan

#23,262 in the World

Chu-Pei, TW
Chu-Pei, Taiwan
Forward Citations = 101

24 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Yield Microelectronics Corp.. Retrieved from https://idiyas.com/company/yield-microelectronics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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