For the Inventor, By the Inventor

Enter assignee name

Brookfield, CT, United States of America

Wentworth Laboratories Limited

USPTO Granted Patents = 31

% Expired Patents = 9.7

EPO Patents = 4

Trademarks = 5

Forward Citations = 1,150

Loading Chart...

Loading Chart...

30 inventors (with patents filed for the assignee):

Alexander Brandorff (8 out of 15 patents)

Francis T McQuade (8 out of 9 patents)

Arthur Evans (7 out of 7 patents)

4. William F Thiessen (5 out of 5 patents)

5. Stephen Evans (3 out of 4 patents)

6. Jack Robert Lander (2 out of 7 patents)

7. William H Fulton (2 out of 2 patents)

8. Charles L Barto (2 out of 2 patents)

9. John Joseph Fitzpatrick (2 out of 2 patents)

10. Zbigniew Kukielka (2 out of 2 patents)

11. Anthony Paul Martel (2 out of 2 patents)

12. Matthew J Costello (2 out of 10 patents)

13. Joseph R Baker (2 out of 2 patents)

14. Robert L Rogers (1 out of 13 patents)

15. Pasquale Nifo Sarrapochiello (1 out of 1 patent)

Core Competencies:

Probe Cards

Nanotubes

Die Design

Microcircuit Assembly

Thermal Compensation

Probe Pins

Electrical Contacts

Wafer Alignment

Test Probes

Integrated Circuits

Multi-level Assembly

Parametric Measurements

31 patents: Sort by Forward Citations

1. 10234480 - Methods of fabricating probe cards including nanotubes (2019-03-19),

2. 9851378 - Methods of fabricating probe cards including nanotubes (2017-12-26),

3. 9267968 - Probe card assemblies and probe pins including carbon nanotubes (2016-02-23),

4. 7649372 - Die design with integrated assembly aid (2010-01-19),

5. 7554348 - Multi-offset die head (2009-06-30),

6. 7392563 - Probe pin cleaning system (2008-07-01),

7. 7388392 - Die design with integrated assembly aid (2008-06-17),

8. 7282936 - Die design with integrated assembly aid (2007-10-16),

9. 7282934 - Flexible microcircuit space transformer assembly (2007-10-16),

10. 7145353 - Double side probing of semiconductor devices (2006-12-05),

11. 6977515 - Method for forming photo-defined micro electrical contacts (2005-12-20),

12. 6927586 - Temperature compensated vertical pin probing device (2005-08-09),

13. 6906540 - Method for chemically etching photo-defined micro electrical contacts (2005-06-14),

14. 6860027 - Wafer alignment device (2005-03-01),

15. 6756797 - Planarizing interposer for thermal compensation of a probe card (2004-06-29),

Company Overview

Wentworth Laboratories Limited is a specialized company based in Brookfield, CT, focusing on the development and manufacturing of advanced laboratory equipment and analytical instruments. The organization is dedicated to providing innovative solutions for various sectors, including pharmaceuticals, biotechnology, and environmental testing. With a commitment to quality and precision, Wentworth Laboratories aims to enhance research capabilities and support scientific advancements through its cutting-edge technologies and products.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

31 Patents

#3 in Brookfield, CT

#282 in Connecticut

#10,927 in US

#21,260 in the World

Brookfield, CT, United States of America

Wentworth Laboratories Limited

Forward Citations = 1,150

30 inventors:

Alexander Brandorff (8 out of 15 patents)

Francis T McQuade (8 out of 9 patents)

Arthur Evans (7 out of 7 patents)

4. William F Thiessen (5 out of 5 patents)

5. Stephen Evans (3 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Wentworth Laboratories Limited. Retrieved from https://idiyas.com/company/wentworth-laboratories

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…