Company Filing History:
Years Active: 2005
Title: Innovations by Charles L. Barto in Semiconductor Testing
Introduction
Charles L. Barto is a notable inventor based in Oakville, CT, USA, recognized for his contributions in the field of semiconductor technology. With two patents to his name, Barto has significantly impacted the methods used in testing integrated circuits, advancing the precision and effectiveness of electronic testing processes.
Latest Patents
Barto's latest patents include innovative methodologies for forming photo-defined micro electrical contacts. The first patent, titled **"Method for forming photo-defined micro electrical contacts,"** details a process for manufacturing a probe test head crucial for testing semiconductor integrated circuits. This method involves defining probe shapes through one or more masks, fabricating the probes using these masks, and then placing them through holes in both a first and second die. The fabrication process incorporates techniques such as photo-etching and photo-defined electroforming, enhancing the accuracy of probe creation.
The second patent, **"Method for chemically etching photo-defined micro electrical contacts,"** outlines an advanced procedure for fabricating micro probes. This method includes defining probe shapes as a mask, applying a photoresist to a metal foil surface, overlaying the mask, exposing the photoresist to light, and developing it to selectively remove portions of the photoresist. The technique further involves etching the exposed metal foil to produce a multitude of probes, followed by chemical polishing and plating.
Career Highlights
Charles L. Barto is currently affiliated with Wentworth Laboratories Limited, where he continues to innovate and enhance technologies related to semiconductor testing. His work has been instrumental in creating more efficient and precise testing methodologies, contributing to the overall advancement of semiconductor manufacturing.
Collaborations
Barto has collaborated with notable colleagues such as Francis T. McQuade and Phillip M. Truckle, whose collective expertise fosters a dynamic environment for innovation at Wentworth Laboratories Limited. These collaborations continue to drive advancements in testing technologies and methodologies within the semiconductor industry.
Conclusion
In summary, Charles L. Barto's innovative patents and his role at Wentworth Laboratories Limited illustrate his significant impact in the field of semiconductor technology. His contributions are shaping the future of efficient semiconductor testing, and with ongoing collaborations, he continues to pave the way for further advancements in this critical area of innovation.