The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Oct. 24, 2003
Applicants:
Francis T. Mcquade, Watertown, CT (US);
Charles L. Barto, Oakville, CT (US);
Phillip M. Truckle, Newtown, CT (US);
Inventors:
Francis T. McQuade, Watertown, CT (US);
Charles L. Barto, Oakville, CT (US);
Phillip M. Truckle, Newtown, CT (US);
Assignee:
Wentworth Laboratories, Inc., Brookfield, CT (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ; H05K003/02 ;
U.S. Cl.
CPC ...
Abstract
A method of manufacturing a probe test head for testing of semiconductor integrated circuits includes: defining shapes of a plurality of probes as one or more masks; a step for fabricating the plurality of probes using the mask; and disposing the plurality of probes through corresponding holes in a first die and a second die. The step for fabricating the plurality of probes may include one of photo-etching and photo-defined electroforming.