The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Mar. 30, 2005
Jeremy Hope, Hitchin, GB;
Adrian R. Overall, Huntingdon, GB;
John J. Fitzpatrick, Milton Keynes, GB;
Jeremy Hope, Hitchin, GB;
Adrian R. Overall, Huntingdon, GB;
John J. Fitzpatrick, Milton Keynes, GB;
Wentworth Laboratories, Inc., Brookfield, CT (US);
Abstract
A probe head for testing the properties of a semiconducting device () under test including a dielectric film () supporting at least one semiconducting device () under test with a support frame () tautly supporting the dielectric film (). A first support () positions a first probe () for electrically contacting a first side () of the semiconducting device () under test and a second support (), having a actuator to move a second probe () between a first position (P) and a second position (P), positions second probe () with the second position (P) being for electrically contacting an opposing second side () of the semiconductor device under test.