Jeremy Hope

Title: The Innovations of Jeremy Hope

Introduction

Jeremy Hope is a notable inventor based in Hitchin, GB. He has made significant contributions to the field of semiconductor testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing semiconductor devices.

Latest Patents

Jeremy Hope holds a patent for a technology titled "Double side probing of semiconductor devices." This invention features a probe head designed for testing the properties of a semiconducting device under test. The probe head includes a dielectric film that supports at least one semiconducting device, along with a support frame that tautly supports the dielectric film. A first support positions a first probe for electrically contacting a first side of the semiconducting device, while a second support, equipped with an actuator, moves a second probe to contact the opposing side of the semiconductor device. This innovative design allows for more efficient testing of semiconductor devices.

Career Highlights

Jeremy Hope is associated with Wentworth Laboratories Limited, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the capabilities of semiconductor testing.

Collaborations

Throughout his career, Jeremy has collaborated with notable colleagues, including Adrian R Overall and John Joseph Fitzpatrick. These collaborations have contributed to the development of innovative solutions in the semiconductor industry.

Conclusion

In summary, Jeremy Hope is a distinguished inventor whose work in semiconductor testing has led to significant advancements in the field. His patent for double side probing technology exemplifies his commitment to innovation and excellence.