Company Filing History:
Years Active: 2003
Title: Inventor Spotlight: Zbigniew Kukielka of Plainville, CT
Introduction: Zbigniew Kukielka is an accomplished inventor based in Plainville, Connecticut, known for his significant contributions to the field of integrated circuit testing. With two patents to his name, Kukielka has developed innovative solutions that enhance the functionality and reliability of probing devices used in electronic testing.
Latest Patents: Kukielka's most recent inventions include the "Nickel Alloy Probe Card Frame Laminate" and the "Temperature Compensated Vertical Pin Probing Device." The Nickel Alloy Probe Card Frame Laminate features a probe head assembly designed for use in vertical pin probing devices, employing a metallic spacer formed from laminated metallic layers made of Invar, a nickel-iron alloy. This design choice enhances strength and flatness by orienting the metallic grains in a strategic manner.
The Temperature Compensated Vertical Pin Probing Device reflects Kukielka's innovative spirit as it comprises an improved housing with upper and lower Invar spacers. These spacers hold thin sheets of silicon nitride ceramic material that feature laser-drilled holes accommodating probe pins. The combination of Invar and silicon nitride closely matches the thermal expansion coefficients of silicon chips, making it a crucial advancement for maintaining accuracy across various temperatures during testing.
Career Highlights: Zbigniew Kukielka is associated with Wentworth Laboratories Limited, a company that specializes in advanced testing solutions for the semiconductor industry. His expertise and inventive approach have solidified his role as a key player in the development of reliable and efficient testing equipment.
Collaborations: Kukielka has collaborated with notable professionals in the field, including Stephen Evans and Francis T. McQuade. This collaboration has fostered an environment of innovation and creativity, allowing them to work together on advancing technology for integrated circuit testing.
Conclusion: Zbigniew Kukielka's contributions to the field of electronic testing exemplify the importance of innovation in technology. His patents serve not only as a testament to his ingenuity but also as essential tools that enhance the reliability of integrated circuit testing. Through continual collaboration and creative problem-solving, Kukielka remains a prominent figure in the world of inventions, pushing boundaries in the realm of semiconductor technology.