Company Filing History:
6 out of 7 
2 out of 31 
2 out of 1,222 
Years Active: 1976-2000
Title: The Innovations of Matthew J Costello
Introduction
Matthew J Costello is a notable inventor based in Bethel, CT, with a remarkable portfolio of 10 patents. His work primarily focuses on advancements in probe technology, which have significant implications in various scientific and engineering fields.
Latest Patents
Among his latest innovations is the "Probe holder for low voltage, low current measurements in a water probe." This invention features a probe holder designed for a wafer probe station, consisting of a pair of over-and-under rigid extensions. One extension receives the probe shank, while the other connects to the probe to establish a Kelvin connection. These coaxial extensions are supported by a vertical tube that houses a pair of coaxial cables linked to triaxial cables outside the probe station enclosure.
Another significant patent is the "Probe station adapter for backside emission inspection." This adapter allows for holding a silicon wafer in an inverted position within a probe station, facilitating backside emission testing. The wafer is positioned in a carrier with an opening for backside emission testing while it is energized and probed beneath the carrier. A unique probe card holder is included, featuring a self-leveling mechanism through a leveling frame that works in conjunction with the wafer carrier.
Career Highlights
Matthew has contributed his expertise to several companies, including Graphic Sciences, Inc. and Wentworth Laboratories Limited. His experience in these organizations has allowed him to refine his skills and develop innovative solutions in the field of probe technology.
Collaborations
Throughout his career, Matthew has collaborated with notable colleagues such as Thomas K Saunders and Robert E Krallinger. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Matthew J Costello's contributions to the field of probe technology through his patents and collaborations highlight his significant impact as an inventor. His work continues to influence advancements in measurement techniques and testing methodologies.