The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Oct. 15, 2007
Applicant:

Alexander Brandorff, New Milford, CT (US);

Inventor:

Alexander Brandorff, New Milford, CT (US);

Assignee:

Wentworth Laboratories, Inc., Brookfield, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An upper die portion of a die head for aligning probe pins in first array of first micro-holes formed in lower die portion of the die head, which generally includes a spacer portion and is adapted to contact lower die portion is typically positioned between second surface and support frame and includes a second array of second micro-holes adapted to receive probe pins generally is in contact or close proximity to first assembly aid film and has a third array of third micro-holes adapted to receive probe pins and third array of third micro-holes are patterned to align with one another but are both offset with first array of first micro-holes by approximately the lateral distance between probe tip and probe head.


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