Company Filing History:
Years Active: 2001-2003
Title: The Innovative Contributions of Stephen Evans
Introduction
Stephen Evans is a notable inventor based in Newtown, CT, who has made significant contributions to the field of integrated circuit testing. With a total of four patents to his name, Evans has developed innovative solutions that enhance the efficiency and accuracy of probing devices used in the semiconductor industry.
Latest Patents
One of Evans' latest patents is the Nickel Alloy Probe Card Frame Laminate. This invention features a probe head assembly designed for vertical pin probing devices, which are essential for electrically testing integrated circuit devices. The assembly includes a metallic spacer made from laminated metallic layers, specifically a 36% nickel and 64% iron alloy known as Invar. By orienting the metallic grains of these layers in a specific manner, Evans has achieved increased strength and flatness in the probe card frame.
Another significant patent is the Temperature Compensated Vertical Pin Probing Device. This improved device incorporates a housing with upper and lower spacers made of Invar, each containing a thin sheet of silicon nitride ceramic material. The sheets are laser-drilled with matching patterns of holes that support probe pins while insulating them from the housing. This design allows the probing device to compensate for temperature variations, ensuring reliable performance across a wide range of probing temperatures.
Career Highlights
Throughout his career, Stephen Evans has worked with reputable companies such as Wentworth Laboratories Limited and Wentworth Laboratories, Inc. His experience in these organizations has contributed to his expertise in developing advanced probing technologies.
Collaborations
Evans has collaborated with notable professionals in his field, including Francis T. McQuade and Zbigniew Kukielka. These collaborations have likely enriched his work and led to further innovations in probing device technology.
Conclusion
Stephen Evans is a distinguished inventor whose work in the field of integrated circuit testing has led to significant advancements. His patents reflect a commitment to innovation and excellence in engineering, making him a valuable contributor to the industry.