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Albuquerque, NM, United States of America

Wavefront Sciences, Inc.

USPTO Granted Patents = 17

Forward Citations = 605

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13 inventors (with patents filed for the assignee):

Daniel Ralph Neal (14 out of 78 patents)

Daniel M Topa (5 out of 5 patents)

Ron R Rammage (4 out of 7 patents)

4. Justin D Mansell (4 out of 4 patents)

5. Richard James Copland (4 out of 56 patents)

6. Daniel Richard Hamrick (4 out of 18 patents)

7. Darrell J Armstrong (3 out of 6 patents)

8. Thomas Daniel Raymond (2 out of 57 patents)

9. William T Turner (2 out of 2 patents)

10. Satish Herekar (1 out of 14 patents)

11. Keith Stantz (1 out of 1 patent)

12. Christopher Burak (1 out of 1 patent)

13. David Austin Neal (1 out of 6 patents)

17 patents: Sort by Forward Citations

1. 7335867 - Method of wavefront sensing by mapping boundaries of a lenslet array onto a grid of pixels (2008-02-26),

2. 7122774 - System and method of wavefront sensing (2006-10-17),

3. 7078665 - System and method of wavefront sensing for determining a location of focal spot (2006-07-18),

4. 6908196 - System and method for performing optical corrective procedures with real-time feedback (2005-06-21),

5. 6864043 - Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles (2005-03-08),

6. 6819413 - Method and system for sensing and analyzing a wavefront of an optically transmissive system (2004-11-16),

7. 6790688 - Method of high pass filtering a data set (2004-09-14),

8. 6656373 - Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles (2003-12-02),

9. 6634750 - Tomographic wavefont analysis system and method of mapping an optical system (2003-10-21),

10. 6624896 - System and method for metrology of surface flatness and surface nanotopology of materials (2003-09-23),

11. 6607274 - Method for computing visual performance from objective ocular aberration measurements (2003-08-19),

12. 6550917 - Dynamic range extension techniques for a wavefront sensor including use in ophthalmic measurement (2003-04-22),

13. 6547395 - Methods of measuring moving objects and reducing exposure during wavefront measurements (2003-04-15),

14. 6376819 - Sub-lens spatial resolution Shack-Hartmann wavefront sensing (2002-04-23),

15. 6184974 - Apparatus and method for evaluating a target larger than a measuring aperture of a sensor (2001-02-06),

Company Overview

Wavefront Sciences, Inc. is a technology company based in Albuquerque, NM, specializing in advanced imaging and optical systems. The organization focuses on developing innovative solutions for applications in various fields, including biomedical imaging and optical metrology. By leveraging cutting-edge research in optics and imaging technologies, Wavefront Sciences aims to enhance the precision and effectiveness of diagnostic tools and measurement systems, contributing to advancements in healthcare and scientific research.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

17 Patents

#35 in Albuquerque, NM

#46 in New Mexico

#18,903 in US

#35,948 in the World

Albuquerque, NM, United States of America

Wavefront Sciences, Inc.

Forward Citations = 605

13 inventors:

Daniel Ralph Neal (14 out of 78 patents)

Daniel M Topa (5 out of 5 patents)

Ron R Rammage (4 out of 7 patents)

4. Justin D Mansell (4 out of 4 patents)

5. Richard James Copland (4 out of 56 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Wavefront Sciences, Inc.. Retrieved from https://idiyas.com/company/wavefront-sciences

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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