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Albuquerque, NM, United States of America

Wavefront Sciences, Inc.

USPTO Granted Patents = 17

Forward Citations = 602

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13 inventors (with patents filed for the assignee):

Daniel Ralph Neal (14 out of 76 patents)

Daniel M Topa (5 out of 5 patents)

Ron R Rammage (4 out of 7 patents)

4. Justin D Mansell (4 out of 4 patents)

5. Richard James Copland (4 out of 55 patents)

6. Daniel Richard Hamrick (4 out of 18 patents)

7. Darrell J Armstrong (3 out of 6 patents)

8. Thomas Daniel Raymond (2 out of 57 patents)

9. William T Turner (2 out of 2 patents)

10. Satish Herekar (1 out of 12 patents)

11. Keith Stantz (1 out of 1 patent)

12. Christopher Burak (1 out of 1 patent)

13. David Austin Neal (1 out of 6 patents)

17 patents: Sort by Forward Citations

1. 7335867 - Method of wavefront sensing by mapping boundaries of a lenslet array onto a grid of pixels (2008-02-26),

2. 7122774 - System and method of wavefront sensing (2006-10-17),

3. 7078665 - System and method of wavefront sensing for determining a location of focal spot (2006-07-18),

4. 6908196 - System and method for performing optical corrective procedures with real-time feedback (2005-06-21),

5. 6864043 - Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles (2005-03-08),

6. 6819413 - Method and system for sensing and analyzing a wavefront of an optically transmissive system (2004-11-16),

7. 6790688 - Method of high pass filtering a data set (2004-09-14),

8. 6656373 - Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles (2003-12-02),

9. 6634750 - Tomographic wavefont analysis system and method of mapping an optical system (2003-10-21),

10. 6624896 - System and method for metrology of surface flatness and surface nanotopology of materials (2003-09-23),

11. 6607274 - Method for computing visual performance from objective ocular aberration measurements (2003-08-19),

12. 6550917 - Dynamic range extension techniques for a wavefront sensor including use in ophthalmic measurement (2003-04-22),

13. 6547395 - Methods of measuring moving objects and reducing exposure during wavefront measurements (2003-04-15),

14. 6376819 - Sub-lens spatial resolution Shack-Hartmann wavefront sensing (2002-04-23),

15. 6184974 - Apparatus and method for evaluating a target larger than a measuring aperture of a sensor (2001-02-06),

Wavefront Sciences, Inc. is a leading provider of high-resolution metrology solutions for wavefront measurement and analysis. With cutting-edge technology and expertise in optics and wavefront analysis, they offer innovative products and solutions for applications in fields such as ophthalmology, astronomy, and industrial metrology. Through advanced wavefront sensors and software, Wavefront Sciences enables precise and accurate measurement of wavefronts, helping their customers optimize optical systems and improve overall performance. Visit their website to learn more about their products and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

17 Patents

#31 in Albuquerque, NM

#42 in New Mexico

#18,297 in US

#34,825 in the World

Albuquerque, NM, United States of America

Wavefront Sciences, Inc.

Forward Citations = 602

13 inventors:

Daniel Ralph Neal (14 out of 76 patents)

Daniel M Topa (5 out of 5 patents)

Ron R Rammage (4 out of 7 patents)

4. Justin D Mansell (4 out of 4 patents)

5. Richard James Copland (4 out of 55 patents)

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