The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2003
Filed:
Apr. 04, 2002
Keith Stantz, Indianapolis, IN (US);
Daniel R. Neal, Tijeras, NM (US);
Ron Rammage, Tijeras, NM (US);
WaveFront Sciences, Inc., Albuquerque, NM (US);
Abstract
A method for computing the visual performance of a human or animal subject based on objective measurements of visual refraction, including higher order aberrations, includes measuring wavefront aberrations of a subject ocular pupil, computing a point-spread-function from the measured pupil aberration, providing a test image, and convolving the test image with the point-spread-function. A simulated image may be produced from the convolution result of the test image with the point-spread-function. One or more specific terms of the point-spread-function may be subtracted therefrom prior to the convolving step to simulate an effect of a correcting means, such as spectacles lenses, contact lenses, or laser surgery. A best correction for a given subject may be determined by adjusting the terms that are subtracted to optimize the resultant image.