Company Filing History:
4 out of 59 
1 out of 17 
1 out of 832,812 Years Active: 1976-2011
Title: The Innovative Contributions of David Austin Neal
Introduction
David Austin Neal is a notable inventor based in Albuquerque, NM, who has made significant contributions to the field of optical measurement and mapping technologies. With a total of six patents to his name, Neal's work focuses on enhancing the accuracy and efficiency of three-dimensional structure mapping.
Latest Patents
Neal's latest patents include a "System and method of measuring and mapping three-dimensional structures." This innovative system utilizes a projecting optical system to project light onto an object, along with a correction system to compensate for aberrations. An imaging system collects the scattered light, while a wavefront sensor senses the wavefront of the collected light. For highly aberrated structures, multiple wavefront measurements are taken, which are then stitched together to provide a comprehensive characterization of the total structure.
Another significant patent is the "Method and apparatus for obtaining the distance from an optical measurement instrument to an object under test." This system includes an illumination system, an optical system, an optical sensor, and a processor. The illumination system is designed to illuminate the object under test, while the optical system captures the aberrated image. The processor then determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on the aberrated image.
Career Highlights
Throughout his career, David Austin Neal has worked with several companies, including Amo Wavefront Sciences, LLC and Wavefront Sciences, Inc. His expertise in optical technologies has positioned him as a valuable contributor in the field.
Collaborations
Neal has collaborated with notable individuals such as Daniel Ralph Neal and Richard James Copland, further enhancing the innovative projects he has been involved in.
Conclusion
David Austin Neal's contributions to optical measurement and mapping technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of complex optical systems and their applications in real-world scenarios.