Upa Technology, Inc.

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USPTO Granted Patents = 6

Forward Citations = 47

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13 inventors (with patents filed for the assignee):

Robert O Wahl (3 out of 3 patents)

William Silverman (2 out of 2 patents)

Paul Finer (2 out of 2 patents)

4. Jacques J Weinstock (1 out of 5 patents)

5. Derek Lieber (1 out of 5 patents)

6. Sidney Lieber (1 out of 2 patents)

7. William D Hay (1 out of 4 patents)

8. Jay M Lesser (1 out of 1 patent)

9. Philip B Pinches (1 out of 1 patent)

10. Raymond J Prohaska (1 out of 3 patents)

11. Zvi Landau (1 out of 1 patent)

12. Murray Weiser (1 out of 1 patent)

13. Cary I Pincus (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4860329 - X-ray fluorescence thickness measuring device (1989-08-22),

2. 4646341 - Calibration standard for X-ray fluorescence thickness (1987-02-24),

3. 4449048 - Workpiece positioning system for beta ray measuring instruments (1984-05-15),

4. 4437000 - Aperture piece and method for calibrating backscatter thickness (1984-03-13),

5. 4343092 - Probe guide and holder (1982-08-10),

6. 4245189 - Probe assembly for measuring conductivity of plated through holes (1981-01-13),

Company Overview

Upa Technology, Inc. is a leading provider of innovative IT solutions and services. With a focus on cutting-edge technology and customer satisfaction, Upa Technology offers a wide range of services including software development, network infrastructure, and cybersecurity. Our team of experienced professionals are dedicated to delivering high-quality solutions that meet the unique needs of each client. Visit our website to learn more about how Upa Technology can help your business succeed.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#8 in Syosset, NY

#2,698 in New York

#45,027 in US

Syosset, NY, United States of America