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Forward Citations = 47

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13 inventors (with patents filed for the assignee):

Robert O Wahl (3 out of 3 patents)

William Silverman (2 out of 2 patents)

Paul Finer (2 out of 2 patents)

4. Jacques J Weinstock (1 out of 5 patents)

5. Derek Lieber (1 out of 5 patents)

6. Sidney Lieber (1 out of 2 patents)

7. William D Hay (1 out of 4 patents)

8. Jay M Lesser (1 out of 1 patent)

9. Philip B Pinches (1 out of 1 patent)

10. Raymond J Prohaska (1 out of 3 patents)

11. Zvi Landau (1 out of 1 patent)

12. Murray Weiser (1 out of 1 patent)

13. Cary I Pincus (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4860329 - X-ray fluorescence thickness measuring device (1989-08-22),

2. 4646341 - Calibration standard for X-ray fluorescence thickness (1987-02-24),

3. 4449048 - Workpiece positioning system for beta ray measuring instruments (1984-05-15),

4. 4437000 - Aperture piece and method for calibrating backscatter thickness (1984-03-13),

5. 4343092 - Probe guide and holder (1982-08-10),

6. 4245189 - Probe assembly for measuring conductivity of plated through holes (1981-01-13),

Upa Technology, Inc. is a leading provider of innovative IT solutions and services. With a focus on cutting-edge technology and customer satisfaction, Upa Technology offers a wide range of services including software development, network infrastructure, and cybersecurity. Our team of experienced professionals are dedicated to delivering high-quality solutions that meet the unique needs of each client. Visit our website to learn more about how Upa Technology can help your business succeed.

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USPTO Data Jan 1 1976 - Dec 9 2025

6 Patents

#8 in Syosset, NY

#2,569 in New York

#43,751 in US

Syosset, NY, United States of America

Upa Technology, Inc.