Jacques J Weinstock

Title: Jacques J Weinstock: Innovator in Backscatter Measurement Technology

Introduction

Jacques J Weinstock is a notable inventor based in Flushing, NY, with a significant contribution to the field of measurement technology. He holds five patents, showcasing his innovative spirit and technical expertise. His work primarily focuses on backscatter measurement devices, which are essential for assessing the thickness of coatings on various substrates.

Latest Patents

Weinstock's latest patents include an "Aperture piece and method for calibrating backscatter thickness" and a "Backscatter apparatus and method for measuring thickness of a coating." The aperture piece is designed to work with backscatter instruments, allowing for precise measurement of coating thickness on concave workpieces. This invention features a selectively shaped aperture piece that enables calibration of backscatter instruments, ensuring accurate measurements even when the sample support surface does not align perfectly with the concave workpiece. His backscatter measurement device allows for continuous measurement of coating thickness on moving strips of substrate material, enhancing efficiency in industrial applications.

Career Highlights

Throughout his career, Weinstock has worked with various companies, including Unit Process Assemblies, Inc. and UPA Technology, Inc. His experience in these organizations has contributed to his development of innovative measurement technologies.

Collaborations

Weinstock has collaborated with notable professionals in his field, including William D Hay and Derek Lieber. These partnerships have likely fostered an environment of creativity and innovation, leading to advancements in measurement technology.

Conclusion

Jacques J Weinstock's contributions to backscatter measurement technology highlight his role as a significant inventor in this specialized field. His patents reflect a commitment to innovation and precision in measurement techniques.