The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 1980
Filed:
Nov. 15, 1977
James Saunders, Pleasantville, NY (US);
William D Hay, Peekskill, NY (US);
Jacques Weinstock, Flushing, NY (US);
Derek Lieber, North Merrick, NY (US);
Unit Process Assemblies, Inc., Syosset, NY (US);
Abstract
A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.