Peekskill, NY, United States of America

William D Hay


Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1978-1982

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4 patents (USPTO):Explore Patents

Title: Innovations by William D Hay

Introduction

William D Hay is a notable inventor based in Peekskill, NY, who has made significant contributions to the field of measurement technology. With a total of four patents to his name, he has developed innovative solutions that enhance the accuracy and efficiency of coating thickness measurements.

Latest Patents

One of his latest patents is a probe guide and holder designed for holding a coating thickness measurement probe in contact with a coated workpiece. This invention allows for repeatable thickness measurements without the need for manual positioning of the probe head. The probe guide features a holding assembly mounted on a stand, enabling the probe to swivel freely in any direction. This design ensures that the probe can accurately measure coatings on complex shapes, such as jewelry items and turbine blades.

Another significant patent is a backscatter apparatus and method for measuring the thickness of a coating on a moving strip of substrate material. This device includes a measurement wheel equipped with backscatter probes that can irradiate and detect backscattered radiation from the coated substrate. The innovative design allows for thickness measurements to be taken without stopping the movement of the coated strip, thereby increasing efficiency in production processes.

Career Highlights

Throughout his career, William D Hay has worked with various companies, including Unit Process Assemblies, Inc. and UPA Technology, Inc. His experience in these organizations has contributed to his expertise in measurement technologies and innovation.

Collaborations

William has collaborated with notable individuals in his field, including Jacques J Weinstock and Derek Lieber. These partnerships have likely fostered the exchange of ideas and advancements in measurement technology.

Conclusion

William D Hay's contributions to the field of measurement technology through his innovative patents demonstrate his commitment to enhancing accuracy and efficiency in coating thickness measurements. His work continues to impact industries that rely on precise measurement techniques.

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