Probe guide and holder

Abstract

A probe guide for holding a coating thickness measurement probe in contact with a coated workpiece such that repeatable thickness measurements may be made without the necessity of the user manually positioning the probe head for proper contact. The probe guide having a probe holding assembly mounted on a stand; the probe holding assembly constructed to permit the probe to swivel freely in any direction about the geometric center of the probe head face. A workpiece holding means is provided for holding the workpiece against a probe head of the probe. By positioning the workpiece holding means to forceably move the workpiece into contact with the probe head face, the probe will swivel until the resultant vector through the center of moment of the static forces through the workpiece acting on the probe head at the point or points of contact between the workpiece surface and the face of the probe head passes through the geometric center of the probe head face. With this construction, repeatable thickness measurements may be made and the probe may be used to measure coatings on workpieces which have complex shapes such as jewelry items and turbine blades.