Robert O Wahl

Title: Innovator Spotlight: Robert O. Wahl

Introduction

Robert O. Wahl, an accomplished inventor based in Sound Beach, NY, has made significant contributions to the field of thickness measurement technology. With a portfolio comprising three patents, his innovations have advanced the efficiency and accuracy of measurement processes in various industries.

Latest Patents

Wahl's most recent patents showcase his expertise in developing advanced calibration standards and probe holding mechanisms. His patent titled "Calibration Standard for X-ray Fluorescence Thickness" focuses on improving the construction of calibration standards for X-ray fluorescence thickness measurement gauges. This invention includes a design that employs one or more plated layers of known character and thickness, ensuring reliable measurement by making them accessible to X-radiation through an aperture in a protective housing.

Another notable patent by Wahl is the "Probe Guide and Holder," which features an ingenious design for holding coating thickness measurement probes in contact with coated workpieces. This device allows for repeatable thickness measurements without requiring manual adjustment from the user. The probe holding assembly, mounted on a stand, is constructed to permit free swiveling of the probe in any direction, facilitating accurate measurements even on complex-shaped workpieces such as jewelry and turbine blades.

Career Highlights

Throughout his career, Robert O. Wahl has consistently pushed the boundaries of innovation in measurement technology. His dedication to creating user-friendly and precise tools has significant implications for industries reliant on accurate coating thickness measurement. His work with Upa Technology, Inc. has allowed him to further refine his inventions and contribute to the advancement of the field.

Collaborations

Wahl's journey as an inventor has been supported by his collaboration with talented coworkers, including Derek Lieber and Jay M. Lesser. Their combined expertise and innovative mindset have fostered an environment conducive to groundbreaking developments in measurement technologies.

Conclusion

As an inventor with a keen eye for detail and precision, Robert O. Wahl is a valuable contributor to the realm of thickness measurement technology. His patents not only demonstrate his creativity and technical knowledge but also reflect his commitment to improving measurement accuracy across various applications. With his continued efforts and collaboration with skilled colleagues, Wahl is set to remain a prominent figure in the innovation landscape.